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(parent: 9c210bf) | patch
USB: usb_wwan: remove bogus disconnect test in close
authorJohan Hovold <[email protected]>
Thu, 21 Mar 2013 11:36:37 +0000 (12:36 +0100)
committerGreg Kroah-Hartman <[email protected]>
Mon, 25 Mar 2013 20:44:18 +0000 (13:44 -0700)
commite6d144bc27da921b81d46eb7cac461be59ae301b
tree758498e98825111283a14bf0cc95e9dbfbe44c9ftree | snapshot
parent9c210bfa29dc3845ae61b544f673d9753ffa3618commit | diff
USB: usb_wwan: remove bogus disconnect test in close

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: Johan Hovold <[email protected]>
Signed-off-by: Greg Kroah-Hartman <[email protected]>
drivers/usb/serial/usb_wwan.c diff | blob | history
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