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(parent: 1bc77f4) | patch
USB: digi_acceleport: remove bogus disconnect test in close
authorJohan Hovold <[email protected]>
Thu, 21 Mar 2013 11:36:30 +0000 (12:36 +0100)
committerGreg Kroah-Hartman <[email protected]>
Mon, 25 Mar 2013 20:44:17 +0000 (13:44 -0700)
commit28e679ae6fd67023d5e8e61a0092791c5082c21c
treedebb54b9fef063dc721cd5488e5b7e234dc08652tree | snapshot
parent1bc77f4df6b11948893cb1427fb6211c94f51364commit | diff
USB: digi_acceleport: remove bogus disconnect test in close

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: Johan Hovold <[email protected]>
Signed-off-by: Greg Kroah-Hartman <[email protected]>
drivers/usb/serial/digi_acceleport.c diff | blob | history
John Crispins staging tree